| Title: |
Reliability properties of low voltage PZT ferroelectric capacitors and arrays |
| Authors: |
Rodriguez, J.; Remack, K.; Boku, K.; Udayakumar, K.R.; Aggarwal, S.; Summerfelt, S.; Moise, T.; McAdams, H.; McPherson, J.; Bailey, R.; Depner, M.; Fox, G. |
| Source: |
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :200-208 2004 |
| Relation: |
2004 IEEE International Reliability Physics Symposium. Proceedings |
| Database: |
IEEE Xplore Digital Library |