Novel base-band envelope load pull architecture [RF device testing]
| Title: | Novel base-band envelope load pull architecture [RF device testing] |
|---|---|
| Authors: | Williams, T.; Benedikt, J.; Tasker, P.J. |
| Source: | High Frequency Postgraduate Student Colloquium, 2004 High frequency postgraduate student colloquium High Frequency Postgraduate Student Colloquium, 2004. :157-161 2004 |
| Relation: | 2004 High Frequency Postgraduate Student Colloquium |
| Database: | IEEE Xplore Digital Library |