Improving floating-gate memory reliability by nanocrystal storage and pulsed tunnel programming
| Title: | Improving floating-gate memory reliability by nanocrystal storage and pulsed tunnel programming |
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| Authors: | Puzzilli, G.; Caputo, D.; Irrera, F.; Compagnoni, C.M.; Ielmini, D.; Spinelli, A.S.; Lacaita, A.L.; Gerardi, C. |
| Source: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 4(3):390-396 Sep, 2004 |
| Database: | IEEE Xplore Digital Library |