| Title: |
Reliability properties of low-voltage ferroelectric capacitors and memory arrays |
| Authors: |
Rodriguez, J.A.; Remack, K.; Boku, K.; Udayakumar, K.R.; Aggarwal, S.; Summerfelt, S.R.; Celii, F.G.; Martin, S.; Hall, L.; Taylor, K.; Moise, T.; McAdams, H.; McPherson, J.; Bailey, R.; Fox, G.; Depner, M. |
| Source: |
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 4(3):436-449 Sep, 2004 |
| Database: |
IEEE Xplore Digital Library |