Degradation of ultra-thin oxides
| Title: | Degradation of ultra-thin oxides |
|---|---|
| Authors: | Irrera, F.; Puzzilli, G. |
| Source: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 4(3):530-534 Sep, 2004 |
| Database: | IEEE Xplore Digital Library |