| Title: |
Noise characterization of the 0.35 /spl mu/m CMOS analog process implemented in regular and SOI wafers |
| Authors: |
Brouk, I.; Nemirovsky, Y. |
| Source: |
Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004. Electronics, Circuits and Systems Electronics, Circuits and Systems, 2004. ICECS 2004. Proceedings of the 2004 11th IEEE International Conference on. :171-174 2004 |
| Relation: |
ICECS 2004. The 11th IEEE International Conference on Electronics, Circuits and Systems |
| Database: |
IEEE Xplore Digital Library |