A new test structure for measuring on-chip cross-coupling capacitances
| Title: | A new test structure for measuring on-chip cross-coupling capacitances |
|---|---|
| Authors: | Bogliolo, A.; Vaira, F.; Vendrame, L.; Bortesi, L. |
| Source: | Proceedings. 8th IEEE Workshop on Signal Propagation on Interconnects Signal propagation on interconnects Signal Propagation on Interconnects, 2004. Proceedings. 8th IEEE Workshop on. :165-166 2004 |
| Relation: | Proceedings. 8th IEEE Workshop on Signal Propagation on Interconnects |
| Database: | IEEE Xplore Digital Library |