Effects of drain to gate stress on NMOSFET with polysilicon/Hf-silicate gate stack
| Title: | Effects of drain to gate stress on NMOSFET with polysilicon/Hf-silicate gate stack |
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| Authors: | Choi, R.; Lee, B.H.; Young, C.D.; Sim, J.H.; Mathews, K.; Bersuker, G.; Zeitzoff, P. |
| Source: | IEEE International Integrated Reliability Workshop Final Report, 2004 Integrated reliability workshop Integrated Reliability Workshop Final Report, 2004 IEEE International. :128-131 2004 |
| Relation: | 2004 IEEE International Integrated Reliability Workshop Final Report |
| Database: | IEEE Xplore Digital Library |