| Title: |
The effect of elevated temperature lifetest on low frequency noise performance in GaAs PHEMT dual gate MMICs [LNA example] |
| Authors: |
Chou, Y.C.; Callejo, L.; Biedenbander, M.; Lee, K.; Allen, B.; Lai, R.; Kan, Q.; Grundbacher, R.; Leung, D.; Eng, D.; Block, T.; Oki, A. |
| Source: |
JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. Reliability of Compound Semiconductors ROCS Workshop, 2004.[Reliability of Compound Semiconductors]. :69-79 2004 |
| Relation: |
2004 ROCS Workshop Proceedings [Reliability of Compound Semiconductors] |
| Database: |
IEEE Xplore Digital Library |