| Title: |
The de-bias effect of gate current in InP HEMT MMICs |
| Authors: |
Chou, Y.C.; Truong, M.; Leung, D.; Grundbacher, R.; Lai, R.; Eng, D.; Block, T.; Oki, A. |
| Source: |
16th IPRM. 2004 International Conference on Indium Phosphide and Related Materials, 2004. Indium Phosphide and Related Materials Indium Phosphide and Related Materials, 2004. 16th IPRM. 2004 International Conference on. :393-396 2004 |
| Relation: |
2004 International Conference on Indium Phosphide and Related Materials. 16th IPRM |
| Database: |
IEEE Xplore Digital Library |