| Title: |
Peaks in temperature distribution over the area of operating power semiconductor junctions related to the surface leakage current |
| Authors: |
Obreja, V.V.N.; Codreanu, C.; Nuttall, K.I.; Codreanu, I. |
| Source: |
EuroSimE 2005. Proceedings of the 6th International Conference on Thermal, Mechanial and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. Thermal mechanical and multi-physics simulation and experiments in micro-electronics and micro-syste Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on. :584-589 2005 |
| Relation: |
Thermal Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems |
| Database: |
IEEE Xplore Digital Library |