Physical evidence of electromigration in GaAs PHEMT Schottky diodes operating at high forward current density
| Title: | Physical evidence of electromigration in GaAs PHEMT Schottky diodes operating at high forward current density |
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| Authors: | Chou, Y.C.; Leung, D.; Biedenbender, M.; Eng, D.; Kan, Q.; Lai, R.; Block, T.; Oki, A. |
| Source: | [Reliability of Compound Semiconductors] ROCS Workshop, 2005. ROCS Workshop, 2005. [Reliability of Compound Semiconductors]. :167-173 2005 |
| Relation: | ROCS Workshop, 2005. |
| Database: | IEEE Xplore Digital Library |