Via distribution model for yield estimation
| Title: | Via distribution model for yield estimation |
|---|---|
| Authors: | Uezono, T.; Okada, K.; Masu, K. |
| Source: | 7th International Symposium on Quality Electronic Design (ISQED'06) Quality Electronic Design Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on. :6 pp.-484 2006 |
| Relation: | Proceedings of the 2006 7th International Symposium on Quality Electronic Design |
| Database: | IEEE Xplore Digital Library |