Characterizing the stress applied to ICs by different ESD tester circuits
| Title: | Characterizing the stress applied to ICs by different ESD tester circuits |
|---|---|
| Authors: | Boxleitner, W.; Richman, P.; Weil, G. |
| Source: | IEEE International Symposium on Electromagnetic Compatibility Electromagnetic compatibility Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on. :258-264 1990 |
| Relation: | Proceedings of 2002 International Symposium on Electromagnetic Compatibility |
| Database: | IEEE Xplore Digital Library |