Design for testability issues in the implementation of sequential array architectures
| Title: | Design for testability issues in the implementation of sequential array architectures |
|---|---|
| Authors: | Bezzi, G.; Bolchini, C.; Bolzoni, I.; Cantu, S.; Fummi, F.; Sciuto, D. |
| Source: | Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI) Wafer Scale Integration, 1994. Proceedings., Sixth Annual IEEE International Conference on. :169-178 1994 |
| Relation: | Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI) |
| Database: | IEEE Xplore Digital Library |