| Title: |
Reliability Demonstration of a Ferroelectric Random Access Memory Embedded within a 130nm CMOS Process |
| Authors: |
Rodriguez, J.; Remack, K.; Gertas, J.; Boku, K.; Udayakumar, K.R.; Summerfelt, S.; Shinn, G.; Madan, S.; Mcadams, H.; Moise, T.; Eliason, J.; Bailey, R.; Depner, M.; Kim, D.; Staubs, P. |
| Source: |
2007 Non-Volatile Memory Technology Symposium Non-Volatile Memory Technology Symposium, 2007. NVMTS '07. :64-66 Nov, 2007 |
| Relation: |
2007 Non-Volatile Memory Technology Symposium |
| Database: |
IEEE Xplore Digital Library |