| Title: |
Measurement of Thin Film Isotropic and Anisotropic Thermal Conductivity Using 3ω and Thermoreflectance Imaging |
| Authors: |
Maize, K.; Ezzahri, Y.; Wang, X.; Singer, S.; Majumdar, A.; Shakouri, A. |
| Source: |
2008 Twenty-fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium Semiconductor Thermal Measurement and Management Symposium, 2008. Semi-Therm 2008. Twenty-fourth Annual IEEE. :185-190 Mar, 2008 |
| Relation: |
2008 Twenty-fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium |
| Database: |
IEEE Xplore Digital Library |