SRAM Redundancy - Silicon Area versus Number of Repairs Trade-off
| Title: | SRAM Redundancy - Silicon Area versus Number of Repairs Trade-off |
|---|---|
| Authors: | Bickford, Jeanne P.; Rosner, Raymond; Hedberg, Erik; Yoder, Joseph W.; Barnett, Thomas S. |
| Source: | 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI. :387-392 May, 2008 |
| Relation: | 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) |
| Database: | IEEE Xplore Digital Library |