High-Value Design Techniques for Mitigating Random Defect Sensitivities
| Title: | High-Value Design Techniques for Mitigating Random Defect Sensitivities |
|---|---|
| Authors: | Maynard, D. N.; Rosner, R. J.; Hibbeler, J. D.; Culp, J. A.; Barnett, T. S. |
| Source: | IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 21(3):329-336 Aug, 2008 |
| Database: | IEEE Xplore Digital Library |