| Title: |
Measuring the deterministic character of laser damage of dielectrics in ultrashort pulsed regime |
| Authors: |
Sanner, N.; Uteza, O.; Sentis, M.; Lassonde, P.; Legare, F.; Kieffer, J.C. |
| Source: |
CLEO/Europe - EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on. :1-1 Jun, 2009 |
| Relation: |
2009 Conference on Lasers & Electro-Optics Europe & 11th European Quantum Electronics Conference (CLEO/EQEC) |
| Database: |
IEEE Xplore Digital Library |