Optical reflectometry and ellipsometry measurements of graphene and thin graphitic films on bulk low-index substrates
| Title: | Optical reflectometry and ellipsometry measurements of graphene and thin graphitic films on bulk low-index substrates |
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| Authors: | Gaskell, Peter E.; Skulason, Helgi S.; Szkopek, Thomas |
| Source: | 2010 3rd International Nanoelectronics Conference (INEC) Nanoelectronics Conference (INEC), 2010 3rd International. :1305-1306 Jan, 2010 |
| Relation: | 2010 IEEE 3rd International Nanoelectronics Conference (INEC) |
| Database: | IEEE Xplore Digital Library |