Path clustering for adaptive test
| Title: | Path clustering for adaptive test |
|---|---|
| Authors: | Uezono, Takumi; Takahashi, Tomoyuki; Shintani, Michihiro; Hatayama, Kazumi; Masu, Kazuya; Ochi, Hiroyuki; Sato, Takashi |
| Source: | 2010 28th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2010 28th. :15-20 Apr, 2010 |
| Relation: | 2010 28th VLSI Test Symposium (VTS) |
| Database: | IEEE Xplore Digital Library |