| Title: |
An ultra-low-noise Source-Measuring Unit for semiconductor device noise characterization |
| Authors: |
Pace, Calogero; Piacente, Attilio; Vescio, Francesco; Pierro, Silvio; Dalia, Rahul; Bisht, Gaurav Singh |
| Source: |
2010 IEEE Instrumentation & Measurement Technology Conference Proceedings Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE. :482-485 May, 2010 |
| Relation: |
2010 IEEE Instrumentation & Measurement Technology Conference - I2MTC 2010 |
| Database: |
IEEE Xplore Digital Library |