| Title: |
Progressive Schottky junction reaction induced degradation in Pt-sunken gate InP HEMT MMICs for high reliability applications |
| Authors: |
Chou, Y. C.; Leung, D. L.; Biedenbender, M.; Buttari, D.; Eng, D. C.; Tsai, R. S.; Lin, C. H.; Lee, L. S.; Mei, X. B.; Wojtowicz, M.; Barsky, M. E.; Lai, R.; Oki, A. K.; Block, T. R. |
| Source: |
2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :807-812 May, 2010 |
| Relation: |
2010 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |