| Title: |
High reliability performance of 0.1-μm Pt-sunken gate InP HEMT low-noise amplifiers on 100 mm InP substrates |
| Authors: |
Chou, Y. C.; Leung, D. L.; Biedenbender, M.; Eng, D. C.; Buttari, D.; Mei, X. B.; Lin, C. H.; Tsai, R. S.; Lai, R.; Barsky, M. E.; Wojtowicz, M.; Oki, A. K.; Block, T. R. |
| Source: |
2010 22nd International Conference on Indium Phosphide and Related Materials (IPRM) Indium Phosphide & Related Materials (IPRM), 2010 International Conference on. :1-4 May, 2010 |
| Relation: |
2010 22nd International Conference on Indium Phosphide and Related Materials (IPRM) |
| Database: |
IEEE Xplore Digital Library |