Scan based process parameter estimation through path-delay inequalities
| Title: | Scan based process parameter estimation through path-delay inequalities |
|---|---|
| Authors: | Uezono, Takumi; Takahashi, Tomoyuki; Shintani, Michihiro; Hatayama, Kazumi; Masu, Kazuya; Ochi, Hiroyuki; Sato, Takashi |
| Source: | 2010 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2010 IEEE International Symposium on. :3553-3556 May, 2010 |
| Relation: | 2010 IEEE International Symposium on Circuits and Systems (ISCAS) |
| Database: | IEEE Xplore Digital Library |