Test Pattern Selection and Compaction for Sequential Circuits in an HDL Environment
| Title: | Test Pattern Selection and Compaction for Sequential Circuits in an HDL Environment |
|---|---|
| Authors: | Haghbayan, M. H.; Karamati, S.; Javaheri, F.; Navabi, Z. |
| Source: | 2010 19th IEEE Asian Test Symposium Test Symposium (ATS), 2010 19th IEEE Asian. :53-56 Dec, 2010 |
| Relation: | 2010 19th Asian Test Symposium (ATS) |
| Database: | IEEE Xplore Digital Library |