Adaptive test flow for mixed-signal/RF circuits using learned information from device under test
| Title: | Adaptive test flow for mixed-signal/RF circuits using learned information from device under test |
|---|---|
| Authors: | Yilmaz, Ender; Ozev, Sule; Butler, Kenneth M. |
| Source: | 2010 IEEE International Test Conference Test Conference (ITC), 2010 IEEE International. :1-10 Nov, 2010 |
| Relation: | 2010 IEEE International Test Conference (ITC) |
| Database: | IEEE Xplore Digital Library |