Understanding transistor channel temperature in nonlinear microwave measurements and device operation
| Title: | Understanding transistor channel temperature in nonlinear microwave measurements and device operation |
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| Authors: | Baylis, Charles; Jean, Buford Randall; Martin, Josh; Wang, Loria; Moldovan, Matthew; Miller, Hunter |
| Source: | 2010 76th ARFTG Microwave Measurement Conference Microwave Measurement Symposium (ARFTG), 2010 76th ARFTG. :1-5 Nov, 2010 |
| Relation: | 2010 76th ARFTG Microwave Measurement Conference |
| Database: | IEEE Xplore Digital Library |