| Title: |
Low-signature Cadmium Zinc Telluride CZT defect inspection by IR, ultrasound, etch pit density, and x-ray topography |
| Authors: |
Andreini, Kristian; Tkaczyk, J. Eric; Zhang, Tan; Williams, Yana Z.; Nafis, Chris; Abramovich, Gil; Harding, Kevin; Bednarczyk, Peter J.; Chen, Henry; Bindley, Glenn; McKenzie, Jason; Ragothomachar, Balaji; Dudley, Michael |
| Source: |
IEEE Nuclear Science Symposuim & Medical Imaging Conference Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE. :3666-3673 Oct, 2010 |
| Relation: |
2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (2010 NSS/MIC) |
| Database: |
IEEE Xplore Digital Library |