High speed non-linear device characterization and uniformity investigations at X-band frequencies exploiting behavioral models
| Title: | High speed non-linear device characterization and uniformity investigations at X-band frequencies exploiting behavioral models |
|---|---|
| Authors: | Saini, R. S.; Bell, J. W.; Canning, T. A. J.; Woodington, S. P.; FitzPatrick, D.; Lees, J.; Benedikt, J.; Tasker, P. J. |
| Source: | 77th ARFTG Microwave Measurement Conference Microwave Measurement Conference (ARFTG), 2011 77th ARFTG. :1-4 Jun, 2011 |
| Relation: | 2011 77th ARFTG Microwave Measurement Conference (ARFTG) |
| Database: | IEEE Xplore Digital Library |