| Title: |
High ionizing dose effects on ultra thin SiO2/Si structures revealed by Conductive Atomic Force Microscopy |
| Authors: |
Arinero, R.; Touboul, A. D.; Ramonda, M.; Guasch, C.; Gonzalez-Velo, Y.; Boch, J.; Saigne, F. |
| Source: |
2011 12th European Conference on Radiation and Its Effects on Components and Systems Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on. :47-50 Sep, 2011 |
| Relation: |
2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
| Database: |
IEEE Xplore Digital Library |