Test cost reduction through performance prediction using virtual probe
| Title: | Test cost reduction through performance prediction using virtual probe |
|---|---|
| Authors: | Chang, Hsiu-Ming; Cheng, Kwang-Ting; Zhang, Wangyang; Li, Xin; Butler, Kenneth M. |
| Source: | 2011 IEEE International Test Conference Test Conference (ITC), 2011 IEEE International. :1-9 Sep, 2011 |
| Relation: | 2011 IEEE International Test Conference (ITC) |
| Database: | IEEE Xplore Digital Library |