Electrical reliability and breakdown mechanisms in single-walled carbon nanotubes
| Title: | Electrical reliability and breakdown mechanisms in single-walled carbon nanotubes |
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| Authors: | Strus, Mark C.; Keller, Robert R.; Barbosa, N. |
| Source: | 2011 11th IEEE International Conference on Nanotechnology Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on. :715-719 Aug, 2011 |
| Relation: | 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO) |
| Database: | IEEE Xplore Digital Library |