Utilization of RF I-V waveform load-pull information to identify the role FET knee profile has on locating the efficiency maxima
| Title: | Utilization of RF I-V waveform load-pull information to identify the role FET knee profile has on locating the efficiency maxima |
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| Authors: | Canning, Tim; Almuhaisen, Abdullah; Lees, Jonathan; Benedikt, Johannes; Cripps, Steve; Tasker, Paul |
| Source: | 78th ARFTG Microwave Measurement Conference Microwave Measurement Symposium (ARFTG), 2011 78th ARFTG. :1-4 Dec, 2011 |
| Relation: | 2011 78th ARFTG Microwave Measurement Conference |
| Database: | IEEE Xplore Digital Library |