Next generation PowerPC/sup TM/ microprocessor test strategy improvements
| Title: | Next generation PowerPC/sup TM/ microprocessor test strategy improvements |
|---|---|
| Authors: | Pyron, C.; Prado, J.; Golab, J. |
| Source: | Proceedings International Test Conference 1997 Test conference Test Conference, 1997. Proceedings., International. :414-423 1997 |
| Relation: | Proceedings International Test Conference 1997 |
| Database: | IEEE Xplore Digital Library |