Measurements and Simulations of Low Dark Count Rate Single Photon Avalanche Diode Device in a Low Voltage 180-nm CMOS Image Sensor Technology
| Title: | Measurements and Simulations of Low Dark Count Rate Single Photon Avalanche Diode Device in a Low Voltage 180-nm CMOS Image Sensor Technology |
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| Authors: | Leitner, T.; Feiningstein, A.; Turchetta, R.; Coath, R.; Chick, S.; Visokolov, G.; Savuskan, V.; Javitt, M.; Gal, L.; Brouk, I.; Bar-Lev, S.; Nemirovsky, Y. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 60(6):1982-1988 Jun, 2013 |
| Database: | IEEE Xplore Digital Library |