| Title: |
Electrical characterization of undoped diamond films for RF MEMS application |
| Authors: |
Michalas, L.; Koutsoureli, M.; Papandreou, E.; Papaioannou, G.; Saada, S.; Mer, C.; Hugon, R.; Bergonzo, P.; Leuliet, A.; Martins, P.; Bansropun, S.; Ziaei, A. |
| Source: |
2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :6B.3.1-6B.3.7 Apr, 2013 |
| Relation: |
2013 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |