| Title: |
Estimation of hardened flip-flop neutron soft error rates using SRAM multiple-cell upset data in bulk CMOS |
| Authors: |
Gaspard, N.; Jagannathan, S.; Diggins, Z.; McCurdy, M.; Loveless, T. D.; Bhuva, B. L.; Massengill, L. W.; Holman, W. T.; Oates, T. S.; Fang, Y-P.; Wen, S-J.; Wong, R.; Lilja, K.; Bounasser, M. |
| Source: |
2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :SE.6.1-SE.6.5 Apr, 2013 |
| Relation: |
2013 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |