Towards an automatic generation of diagnostic in-field SBST for processor components
| Title: | Towards an automatic generation of diagnostic in-field SBST for processor components |
|---|---|
| Authors: | Scholzel, Mario; Koal, Tobias; Roder, Stephanie; Vierhaus, Heinrich Theodor |
| Source: | 2013 14th Latin American Test Workshop - LATW Test Workshop (LATW), 2013 14th Latin American. :1-6 Apr, 2013 |
| Relation: | 2013 14th Latin American Test Workshop - LATW |
| Database: | IEEE Xplore Digital Library |