A design-for-reliability approach based on grading library cells for aging effects
| Title: | A design-for-reliability approach based on grading library cells for aging effects |
|---|---|
| Authors: | Arasu, Senthil; Nourani, Mehrdad; Carulli, John M.; Butler, Kenneth M.; Reddy, Vijay |
| Source: | 2013 IEEE International Test Conference (ITC) Test Conference (ITC), 2013 IEEE International. :1-7 Sep, 2013 |
| Relation: | 2013 IEEE International Test Conference (ITC) |
| Database: | IEEE Xplore Digital Library |