Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections
| Title: | Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections |
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| Authors: | Gaspard, N. J.; Jagannathan, S.; Diggins, Z. J.; King, M. P.; Wen, S.-J.; Wong, R.; Loveless, T. D.; Lilja, K.; Bounasser, M.; Reece, T.; Witulski, A. F.; Holman, W. T.; Bhuva, B. L.; Massengill, L. W. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 60(6):4368-4373 Dec, 2013 |
| Database: | IEEE Xplore Digital Library |