Detecting defects in adhesion between a metal hemisphere and a polymer base
| Title: | Detecting defects in adhesion between a metal hemisphere and a polymer base |
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| Authors: | Salmi, A.; Heino, O.; Nieminen, H. J.; Salmi, T.; Karppinen, P.; Patola, T.; Haeggstrom, E.; Hacking, S. A. |
| Source: | 2013 IEEE International Ultrasonics Symposium (IUS) Ultrasonics Symposium (IUS), 2013 IEEE International. :695-698 Jul, 2013 |
| Relation: | 2013 IEEE International Ultrasonics Symposium (IUS) |
| Database: | IEEE Xplore Digital Library |