A Variability-Aware Adaptive Test Flow for Test Quality Improvement
| Title: | A Variability-Aware Adaptive Test Flow for Test Quality Improvement |
|---|---|
| Authors: | Shintani, M.; Uezono, T.; Takahashi, T.; Hatayama, K.; Aikyo, T.; Masu, K.; Sato, T. |
| Source: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 33(7):1056-1066 Jul, 2014 |
| Database: | IEEE Xplore Digital Library |