Refractive index measurement in TCO layers for micro optoelectronic devices
| Title: | Refractive index measurement in TCO layers for micro optoelectronic devices |
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| Authors: | Daliento, S.; Guerriero, P.; Addonizio, M.; Antonaia, A.; Gambale, E. |
| Source: | 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on. :265-268 May, 2014 |
| Relation: | 2014 IEEE 29th International Conference on Microelectronics (MIEL) |
| Database: | IEEE Xplore Digital Library |