| Title: |
Soft error rate comparison of various hardened and non-hardened flip-flops at 28-nm node |
| Authors: |
Gaspard, N.; Jagannathan, S.; Diggins, Z. J.; Mahatme, N. N.; Loveless, T. D.; Bhuva, B. L.; Massengill, L. W.; Holman, W. T.; Narasimham, B.; Oates, A.; Marcoux, P.; Tam, N.; Vilchis, M.; Wen, S.-J.; Wong, R.; Xu, Y. Z. |
| Source: |
2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :SE.5.1-SE.5.5 Jun, 2014 |
| Relation: |
2014 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |