| Title: |
Angled flip-flop single-event cross sections for submicron bulk CMOS technologies |
| Authors: |
Gaspard, N.; Jagannathan, S.; Diggins, Z.; Reece, T.; Wen, S-J.; Wong, R.; Lilja, K.; Bounasser, M.; Loveless, T. D.; Holman, W. T.; Bhuva, B. L.; Massengill, L. W. |
| Source: |
2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on. :1-4 Sep, 2013 |
| Relation: |
2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
| Database: |
IEEE Xplore Digital Library |