Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers
| Title: | Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers |
|---|---|
| Authors: | Diggins, Z. J.; Mahadevan, N.; Herbison, D.; Karsai, G.; Sierawski, B. D.; Barth, E.; Pitt, E. B.; Reed, R. A.; Schrimpf, R. D.; Weller, R. A.; Alles, M. L.; Witulski, A. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 61(6):2979-2984 Dec, 2014 |
| Database: | IEEE Xplore Digital Library |