| Title: |
Evaluation of the Extreme Learning Machine for automatic fault diagnosis of the Tennessee Eastman chemical process |
| Authors: |
de Assis Boldt, Francisco; Rauber, Thomas W.; Varejao, Flavio M. |
| Source: |
IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society Industrial Electronics Society, IECON 2014 - 40th Annual Conference of the IEEE. :2551-2557 Oct, 2014 |
| Relation: |
IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society |
| Database: |
IEEE Xplore Digital Library |