A 40 nm CMOS I/O Pad Design With Embedded Capacitive Coupling Receiver for Non-Contact Wafer Probe Test
| Title: | A 40 nm CMOS I/O Pad Design With Embedded Capacitive Coupling Receiver for Non-Contact Wafer Probe Test |
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| Authors: | Scarselli, E. F.; Perilli, L.; Perugini, L.; Canegallo, R. |
| Source: | IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 62(7):1737-1746 Jul, 2015 |
| Database: | IEEE Xplore Digital Library |